Dharmendra Mewada
Physics
October 2025
This paper describes the preparation, molecular characterization and dielectric investigation of a single-phase oxide substance that was produced through the solid-state reaction mechanism. The X-ray diffraction (XRD) was used to determine phase purity and the crystallite size was approximately 45 nm. The Fourier-transform infrared spectroscopy (FTIR) and scanning electron microscopy (SEM) revealed characteristic metal-oxygen vibrations and dense and fine-grained microstructure of low porosity. Electrical values were obtained between the frequency range of 1 kHz to 1 MHz and temperature range of 300C to 200C and the dielectric constant ( ε' ) was observed to decrease with frequency and the dielectric constant ( ε' ) and AC conductivity was observed to increase with temperature, showing interfacial polarization and thermally activated hopping conductivity. The dielectric constant and reduced dielectric loss proved by comparison with other oxide materials to have the best polarization stability. The results indicate that the oxide material that has been produced is a good candidate material that can be used in capacitors, sensors, and other high-frequency electronics
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